SILC

常见例句

• The generation mechanism of stress induced leakage current( SILC) in flash memory cell is studied by experiments.
  通过实验研究了闪速存储器存储单元中应力诱生漏电流(ILC)产生机理.
• The results show that compared with the pure oxide gate dielectrics of the same EOT,N/O stack gate dielectrics have much better performance on the aspects of tunneling leakage current,SILC characteristics,and gate dielectrics lifetime.
  结果表明 ;同样EOT的Si3 N4/SiO2 stack栅介质和纯SiO2 栅介质比较 ;前者在栅隧穿漏电流、抗SILC性能、栅介质寿命等方面都远优于后者 .
• stress induced leakage current(SILC)
  应力诱生漏电流（SILC）
• Effect of Neutral Traps on Tunneling Current and SILC in Ultrathin Oxide Layer
  超薄氧化层中的中性陷阱对隧穿电流的影响和应变诱导漏电流
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